T. Baumbach, Germany
"High quality X-ray imaging for semiconductor wafer characterisation"
P. Kiesel, Germany
"Direct Determination of the Built-in Polarization Field in InGaN/GaN Quantum Wells"
Z.L. Weber, USA
"Differences and similarities between structural properties of GaN grown by different growth methods"
C. Jagadish, Australia
"Electrical Isolation of ZnO by Ion Irradiation"
K. Unterrainer, Austria
"Few-Cycle THz Pulse Generation And Spectroscopy of Semiconductor Nanostructures"
I. Yonenaga, Japan
"Growth and fundamental properties of GeSi bulk crystals"
***Summary Table of Abstracts Evaluation***